Impact of parasitic bipolar action and soft-error trend in bulk CMOS at terrestrial environment

Authors :: Taiki Uemura
Takashi Kato
Hideya Matsuyama
Source :: 2013 IEEE International Reliability Physics Symposium (IRPS).
Publication Year :: 2013
Publisher :: IEEE, 2013.
Abstract: We investigate an impact of parasitic bipolar action on 28nm sequential elements in the terrestrial environment through spallation neutron beam irradiation tests. We discuss the contribution of parasitic bipolar action to the technology trend of SER through neutron tests on Flip-Flops and SRAMs.

Subjects :: Engineering
Hardware_MEMORYSTRUCTURES
business.industry
Logic testing
Hardware_PERFORMANCEANDRELIABILITY
Neutron radiation
Action (physics)
Soft error
CMOS
Hardware_INTEGRATEDCIRCUITS
Electronic engineering
Cmos logic circuits
Spallation
Neutron
business
Hardware_LOGICDESIGN

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