(Invited) Multi-Modality X-Ray Imaging at a 10 Nanometer Resolution

The Hard X-ray Nanoprobe (HXN) beamline at the NSLS-II is constructed to explore new frontiers of the x-ray microscopy, by enabling an unprecedented spatial resolution of ~10 nm in the hard x-ray regime. The beamline offers simultaneous multi-modality imaging capabilities including x-ray fluorescence, x-ray diffraction, x-ray absorption, x-ray scattering, phase-contrast imaging, spectroscopy, and ptychography. These suite of imaging tools open up new scientific opportunities to visualize complex nanostructures with unprecedented sensitivity to material composition, morphology, crystalline phases/strain, and chemical state. Use of hard x-rays allows accurate quantification of buried nanostructure with straightforward analyses. Presentation will describe the present and near-future scientific capabilities of this new imaging facility with the recent results.