DRAM Architecture and Testing

Authors :: F.J. Meyer
Bruce F. Cockburn
Fabrizio Lombardi
Source :: IEEE Design & Test of Computers. 16:19-21
Publication Year :: 1999
Publisher :: Institute of Electrical and Electronics Engineers (IEEE), 1999.

Subjects :: Engineering
Random access memory
business.industry
Electrical engineering
Dielectric
Threshold voltage
Built-in self-test
Hardware and Architecture
Electronic engineering
Electrical and Electronic Engineering
Architecture
business
Software
Dram

Tools