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X-Ray fluorescence measurements of advanced organic materials
- Source :
- Journal of Electron Spectroscopy and Related Phenomena. :889-894
- Publication Year :
- 2001
- Publisher :
- Elsevier BV, 2001.
-
Abstract
- The results of X-ray fluorescence measurements of advanced organic materials (organic semiconductors, superconductors and molecular magnets) are presented. The electronic structure and chemical bonding of these materials is discussed basing on comparison of X-ray emission spectra with spectra of reference samples and our MO LCAO calculations.
- Subjects :
- Superconductivity
Radiation
Chemistry
Astrophysics::High Energy Astrophysical Phenomena
Analytical chemistry
X-ray fluorescence
Electronic structure
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Spectral line
Electronic, Optical and Magnetic Materials
Organic semiconductor
Chemical bond
Linear combination of atomic orbitals
Emission spectrum
Physical and Theoretical Chemistry
Spectroscopy
Subjects
Details
- ISSN :
- 03682048
- Database :
- OpenAIRE
- Journal :
- Journal of Electron Spectroscopy and Related Phenomena
- Accession number :
- edsair.doi...........bb859d988f765076f59d8cc9832973c6
- Full Text :
- https://doi.org/10.1016/s0368-2048(00)00388-1