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Robust extraction of the frequency-dependent characteristic impedance of transmission lines using one-port TDR measurements

Robust extraction of the frequency-dependent characteristic impedance of transmission lines using one-port TDR measurements

Authors :
Woopoung Kim
Rao Tummala
Madhavan Swaminathan
Seock Hee Lee
Source :
IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565).
Publication Year :
2002
Publisher :
IEEE, 2002.

Abstract

This paper discusses a method for extracting the frequency dependent characteristic impedance of transmission lines from Time Domain Reflectometry (TDR) measurements using an Open, Short, Load, and Shortline calibration. The frequency dependent behavior of transmission lines was successfully captured using this method. Two types of transmission lines were measured using this method namely, thick metal transmission lines in Printed Wiring Board (PWB) and thin transmission lines in MCM-L technology.

Details

Database :
OpenAIRE
Journal :
IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)
Accession number :
edsair.doi...........bdfba452640c9b434b024ab811986549
Full Text :
https://doi.org/10.1109/epep.2001.967624