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Growth of AlN layer on patterned sapphire substrate by hydride vapor phase epitaxy

Authors :
Gang Seok Lee
Chanmi Lee
Nobuhiko Sawaki
Suck-Whan Kim
Jae Hak Lee
Min Yang
Young Moon Yu
Yoshio Honda
Chanbin Lee
Sam Nyung Yi
Hunsoo Jeon
Hyung Soo Ahn
Sung Geun Bae
Source :
Japanese Journal of Applied Physics. 55:05FC02
Publication Year :
2016
Publisher :
IOP Publishing, 2016.

Abstract

Even though a patterned sapphire substrate (PSS) has been used for the growth of a high-quality epilayer because of its many advantages, it has not been successfully used to grow an AlN epilayer for ultraviolet (UV) light-emitting diodes (LEDs) on a PSS up to now. We report the growth of a high-quality AlN epilayer on a PSS, as a substrate for the manufacture of UV LEDs, by hydride vapor phase epitaxy (HVPE). The X-ray diffraction (XRD) peaks for the AlN epilayer grown on the PSS indicate that crystalline AlN with a wurtzite structure was grown successfully on the PSS. Furthermore, HVPE combining both in situ HVPE technology and liquid-phase epitaxy (LPE) using a mixed source is proposed as a novel method for the growth of a flat AlN epilayer on a PSS.

Details

ISSN :
13474065 and 00214922
Volume :
55
Database :
OpenAIRE
Journal :
Japanese Journal of Applied Physics
Accession number :
edsair.doi...........be4b26c030aaebe60da75261c202c9e4
Full Text :
https://doi.org/10.7567/jjap.55.05fc02