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Correlation between ion-flux and microstructure of a-C:H films
- Source :
- Diamond and Related Materials. 1:316-320
- Publication Year :
- 1992
- Publisher :
- Elsevier BV, 1992.
-
Abstract
- a-C:H layers prepared at different ion energies have been characterised by several methods such as13C-NMR, EELS and ESR. With increasing ion energies from 30 eV to 170 eV, the sp2 fraction of the samples rises from 27% to about 60% and the spin density increases by more than one order of magnitude due to less incorporation of hydrogen into the film. Simulaneously, the linewidth of the ESR signal becomes narrower. This can be interpreted as an increasing cluster size from single benzene rings to 3 or 4 fused 6-fold rings. Measurements of the ion energy distribution (IED) of the positive ion flux to the substrate surface indicate a saddle-shaped peak structure typical of a resistive plasma sheath. Mass spectra of the ion flux can be correlated, to a certain degree, to the appearance potentials of electron-molecule and ion-molecule collisions.
- Subjects :
- Debye sheath
Hydrogen
Chemistry
Mechanical Engineering
Analytical chemistry
chemistry.chemical_element
Flux
General Chemistry
Microstructure
Electronic, Optical and Magnetic Materials
Ion
Laser linewidth
symbols.namesake
Physics::Plasma Physics
Materials Chemistry
Mass spectrum
symbols
Electrical and Electronic Engineering
Order of magnitude
Subjects
Details
- ISSN :
- 09259635
- Volume :
- 1
- Database :
- OpenAIRE
- Journal :
- Diamond and Related Materials
- Accession number :
- edsair.doi...........bf625bb27b21d26f9ebd36db61515d5c
- Full Text :
- https://doi.org/10.1016/0925-9635(92)90048-s