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Correlation between ion-flux and microstructure of a-C:H films

Authors :
A. Kru¨ger
H. Ehrhardt
K. Jung
F. Engelke
R. Kleber
W. Dworschak
I. Mu¨hling
H. Metz
Source :
Diamond and Related Materials. 1:316-320
Publication Year :
1992
Publisher :
Elsevier BV, 1992.

Abstract

a-C:H layers prepared at different ion energies have been characterised by several methods such as13C-NMR, EELS and ESR. With increasing ion energies from 30 eV to 170 eV, the sp2 fraction of the samples rises from 27% to about 60% and the spin density increases by more than one order of magnitude due to less incorporation of hydrogen into the film. Simulaneously, the linewidth of the ESR signal becomes narrower. This can be interpreted as an increasing cluster size from single benzene rings to 3 or 4 fused 6-fold rings. Measurements of the ion energy distribution (IED) of the positive ion flux to the substrate surface indicate a saddle-shaped peak structure typical of a resistive plasma sheath. Mass spectra of the ion flux can be correlated, to a certain degree, to the appearance potentials of electron-molecule and ion-molecule collisions.

Details

ISSN :
09259635
Volume :
1
Database :
OpenAIRE
Journal :
Diamond and Related Materials
Accession number :
edsair.doi...........bf625bb27b21d26f9ebd36db61515d5c
Full Text :
https://doi.org/10.1016/0925-9635(92)90048-s