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A 1Tb 4b/cell 64-stacked-WL 3D NAND flash memory with 12MB/s program throughput

Authors :
Ki-whan Song
Gyo Soo Choo
Kitae Park
Kye-Hyun Kyung
Dae-Seok Byeon
Jisu Kim
Jinbae Bang
Moosung Kim
Lee Kang-Bin
Lee Han-Jun
Seung-Bum Kim
Seonyong Lee
Minyeong Lee
Sung-Min Joe
Jinwon Choi
Jonghoo Jo
Kyung Min Kim
Chulbum Kim
Jeong-Don Lim
Young-Sun Min
Young-don Choi
Joon-Suc Jang
Dongjin Shin
Nahyun Kim
Rho Young-Sik
Park Jiyoon
Jungkwan Kim
Hwajun Jang
Yong-Ha Park
Deokwoo Lee
Young-Hwan Ryu
SeonGeon Lee
Yu Chung-Ho
Ho-joon Kim
Minseok Kim
Jonghoon Park
Hyun-Jin Kim
Seung-Hyun Moon
Seung-jae Lee
Cheon An Lee
Sohyun Park
Minsu Kim
Source :
ISSCC
Publication Year :
2018
Publisher :
IEEE, 2018.

Abstract

Since the first demonstration of a production quality three-dimensional (3D) stacked-word-line NAND Flash memory [1], the 3b/cell 3D NAND Flash memory has seen areal density increases of more than 50% per year due to the aggressive development of 3D-wordline-stacking technology. This trend has been consistent for the last three consecutive years [2-4], however the storage market still requires higher density for diverse digital applications. A 4b/cell technology is one promising solution to increase bit density [5]. In this paper, we propose a 4b/cell 3D NAND Flash memory with a 12MB/s program throughput. The chip achieves a 5.63Gb/mm2 areal density, which is a 41.5% improvement as compared to a 3b/cell NAND Flash memory in the same 3D-NAND technology [4].

Details

Database :
OpenAIRE
Journal :
2018 IEEE International Solid - State Circuits Conference - (ISSCC)
Accession number :
edsair.doi...........c1061af1afa2380c8f8a7e3fdb327e8b
Full Text :
https://doi.org/10.1109/isscc.2018.8310323