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Light absorption by an atomic force microscope probe
- Source :
- Journal of Physics: Conference Series. 816:012036
- Publication Year :
- 2017
- Publisher :
- IOP Publishing, 2017.
-
Abstract
- In this paper a probe of an atomic force microscope (AFM) served as a detector of optical radiation. We investigated absorption of optical radiation in the visible range by commercially available Si and Si3N4 probes. It has been shown that the radiation in the far field is mainly absorbed in the probe tip. By scanning a laser beam with a diameter of ~ 0.7 microns by the AFM probe, a lateral resolution of ~ 1.5 microns was demonstrated. Numerical modeling of evanescent wave absorption by AFM probes showed enhancement of the absorption in the probes as compared with a flat surface. A Si3N4 probe more effectively absorbs the evanescent radiation.
- Subjects :
- History
Scanning Hall probe microscope
Microscope
Atomic de Broglie microscope
Materials science
business.industry
Physics::Optics
Atomic force acoustic microscopy
Scanning capacitance microscopy
Computer Science Applications
Education
law.invention
Scanning probe microscopy
Optics
law
Magnetic force microscope
business
Non-contact atomic force microscopy
Subjects
Details
- ISSN :
- 17426596 and 17426588
- Volume :
- 816
- Database :
- OpenAIRE
- Journal :
- Journal of Physics: Conference Series
- Accession number :
- edsair.doi...........c19c6c73ba01b3323918d4f488db7963