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Noise Performances of 0.13 μm CMOS Technologies for Detector Front-end Applications

Authors :
M. Manghisoni
L. Ratti
V. Re
V. Speziali
G. Traversi
Source :
IEEE Nuclear Science Symposium Conference Record, 2005.
Publication Year :
2006
Publisher :
IEEE, 2006.

Subjects

Subjects :
Front and back ends
Noise
Materials science
CMOS
business.industry
Nuclear electronics
Detector
Electrical engineering
Readout electronics
Mixed-signal integrated circuit
White noise
business

Details

Database :
OpenAIRE
Journal :
IEEE Nuclear Science Symposium Conference Record, 2005
Accession number :
edsair.doi...........c1fbabd745c75eff3979b74ec695145f
Full Text :
https://doi.org/10.1109/nssmic.2005.1596412
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