A study on the electrical switching mechanism in [TBA]x[Ni(dmid)2] thin film materials by XPS

Authors :: Yunqi Liu
Sheng-Gao Liu
Daoben Zhu
Source :: Synthetic Metals. 86:2265-2266
Publication Year :: 1997
Publisher :: Elsevier BV, 1997.
Abstract: A study on the electrical switching mechanism in [TBA] x [Ni(dmid) 2 ] thin film materials, in which reproducible current-controlled bistable electrical switching and memory phenomena could be observed [1], by X-ray photoelectron spectroscopy (XPS) was reported. The effects of fabrication electrodes and preparation conditions of the sandwich structure devices on the switching behavior were presented as well.

Subjects :: Fabrication
Bistability
business.industry
Chemistry
Mechanical Engineering
Metals and Alloys
Analytical chemistry
Molecular electronics
Electrical switching
Condensed Matter Physics
Electronic, Optical and Magnetic Materials
X-ray photoelectron spectroscopy
Mechanics of Materials
Electrode
Materials Chemistry
Optoelectronics
Commutation
Thin film
business

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