Back to Search Start Over

Rotatable broadband retarders for far-infrared spectroscopic ellipsometry

Authors :
E. C. Standard
G. L. Carr
Michael Kotelyanskii
Tao Zhou
Tae Dong Kang
Andrei Sirenko
Source :
Thin Solid Films. 519:2698-2702
Publication Year :
2011
Publisher :
Elsevier BV, 2011.

Abstract

Rotatable retarders have been developed for applications in spectroscopic, full Mueller Matrix ellipsometry in the far-IR spectral range. Several materials, such as silicon, KRS-5, and a commercial polymer plastic (TOPAS) have been utilized to achieve a fully adjustable retardation between 0° and 90°. Experimental characteristics of the rotatable retarders that utilize three- and four-bounce designs are compared with calculations. We discuss the effect of light focusing on the performance of these rotatable retarders.

Details

ISSN :
00406090
Volume :
519
Database :
OpenAIRE
Journal :
Thin Solid Films
Accession number :
edsair.doi...........c4565c2a38e9bce6f30a519f33e54e74
Full Text :
https://doi.org/10.1016/j.tsf.2010.12.057