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Depth From Light Fields Analyzing 4D Local Structure

Authors :
J. P. Luke
J. C. Sanluis
José Manuel Rodríguez-Ramos
C. Dominguez Conde
J. G. Marichal-Hernandez
F. Rosa
Source :
Journal of Display Technology. 11:900-907
Publication Year :
2015
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2015.

Abstract

In this paper, we develop a local method to obtain depths from the 4D light field. In contrast to previous local depth from light field methods based on EPIs, e.g., 2D slices of the light field, the proposed method takes into account the 4D nature of the light field and uses its four dimensions. Furthermore, our technique adapts well to parallel hardware. The performance of the method is tested against a publicly available benchmark dataset and compared with other algorithms that previously have been tested with the same benchmark. Results show that the proposed method can achieve competitive results in reasonable time.

Details

ISSN :
15589323 and 1551319X
Volume :
11
Database :
OpenAIRE
Journal :
Journal of Display Technology
Accession number :
edsair.doi...........c4f8b5ba2e76d10aa59b9d41232ed51f
Full Text :
https://doi.org/10.1109/jdt.2014.2360992