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Magnetoresistance properties of thin films of the metallic oxide ferromagnetSrRuO3
- Source :
- Physical Review B. 52:3459-3465
- Publication Year :
- 1995
- Publisher :
- American Physical Society (APS), 1995.
-
Abstract
- The magnetoresistance of epitaxial thin films (250 to 1000 \AA{} thick) of the metallic oxide ferromagnet ${\mathrm{SrRuO}}_{3}$ has been measured at temperatures ranging from well below to just above the Curie point (\ensuremath{\approxeq}160 K). Measurements using both transverse (nonzero Lorentz force) and longitudinal (zero Lorentz force) geometries cleanly distinguish between an orbital contribution, present only at low temperature, and a spin-flip scattering contribution, present at all temperatures, to the resistivity in magnetic field. The magnetoresistance also shows strongly hysteretic behavior with high coercive and saturation fields. Through the Curie point, the magnetoresistance magnitude shows a maximum, which results from the suppression of the phase transition in magnetic field. The temperature derivative of the zero-field resistivity also shows a discontinuous jump, as predicted by standard theory.
- Subjects :
- Phase transition
Materials science
Condensed matter physics
Magnetoresistance
Magnetic field
Condensed Matter::Materials Science
symbols.namesake
Ferromagnetism
Electrical resistivity and conductivity
Saturation (graph theory)
symbols
Curie temperature
Condensed Matter::Strongly Correlated Electrons
Lorentz force
Subjects
Details
- ISSN :
- 10953795 and 01631829
- Volume :
- 52
- Database :
- OpenAIRE
- Journal :
- Physical Review B
- Accession number :
- edsair.doi...........c558cb6c52d780954b429f2b6785cb32
- Full Text :
- https://doi.org/10.1103/physrevb.52.3459