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Performance analysis of device characteristics in Negative Capacitance Field Effect Transistor

Authors :
Sanjeet Kumar Sinha
Amandeep Singh
Source :
2021 Second International Conference on Electronics and Sustainable Communication Systems (ICESC).
Publication Year :
2021
Publisher :
IEEE, 2021.

Abstract

With the advancement in technology and new insights of MOSFET fabrications, power consumption in VLSI circuits has been optimized to a greater extent. In this work, a comparative analysis is done for the intervention of negative capacitance on baseline switching element i.e. MOSFET. Negative capacitance acts as a transformer, that steps up the gate-source voltage ( $V_{GS}$ ) of field effect transistor thus maintaining a high $I_{on}$ current. A thin layer of $Fe$ material is added with the gate stack of MOSFET to form a series combination of Ferroelectric capacitor ( $C_{FE}$ ) and dielectric capacitor. Device characteristics have been plotted and sub-threshold swing (SS) has shown remarkable improvement by the integration of negative capacitance effect as compared to baseline MOSFET. Steeper SS of 50.75 mV/dec is achieved in case of NCFET. This work indicates that NCFET has a great potential to replace the conventional MOSFET device in low power circuits.

Details

Database :
OpenAIRE
Journal :
2021 Second International Conference on Electronics and Sustainable Communication Systems (ICESC)
Accession number :
edsair.doi...........c612f8b18ea5751523b136ae51028841