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Parasitic Capacitance Analysis in Short Channel GaN MIS-HEMTs

Authors :
R. Kom Kammeugne
C. Leroux
T. Mota Frutuoso
J. Cluzel
L. Vauche
C. Le Royer
R. Gwoziecki
X. Garros
F. Gaillard
M. Charles
E. Bano
G. Ghibaudo
Source :
ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC).
Publication Year :
2021
Publisher :
IEEE, 2021.

Details

Database :
OpenAIRE
Journal :
ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC)
Accession number :
edsair.doi...........c6d94ca0e60d5a44939ec6f9faa39f86