Cite
Failure rate calculation for NMOS devices under multiple failure mechanisms
MLA
Xin Liu, et al. “Failure Rate Calculation for NMOS Devices under Multiple Failure Mechanisms.” Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), July 2013. EBSCOhost, https://doi.org/10.1109/ipfa.2013.6599182.
APA
Xin Liu, Shi Qian, Zhenwei Zhou, Yunfei En, & Wang Xiaohan. (2013). Failure rate calculation for NMOS devices under multiple failure mechanisms. Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). https://doi.org/10.1109/ipfa.2013.6599182
Chicago
Xin Liu, Shi Qian, Zhenwei Zhou, Yunfei En, and Wang Xiaohan. 2013. “Failure Rate Calculation for NMOS Devices under Multiple Failure Mechanisms.” Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), July. doi:10.1109/ipfa.2013.6599182.