Density of States in Amorphous In-Ga-Zn-O Thin-Film Transistor under Negative Bias Illumination Stress

Authors :: Haruka Yamazaki
Mami N. Fujii
Juan Paolo Bermundo
Satoshi Urakawa
Masahiro Horita
Yoshihiro Ueoka
Yasuaki Ishikawa
Yukiharu Uraoka
Source :: ECS Journal of Solid State Science and Technology. 3:Q3001-Q3004
Publication Year :: 2014
Publisher :: The Electrochemical Society, 2014.

Subjects :: Chemical substance
Materials science
business.industry
Negative bias
Electronic, Optical and Magnetic Materials
law.invention
Amorphous solid
Stress (mechanics)
Magazine
law
Thin-film transistor
Density of states
Optoelectronics
business
Science, technology and society

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