Analysis of advanced circuits for SET measurement

Single Event Transients (SETs) are a growing concern in advanced integrated circuits yet techniques to accurately characterize the cross-section and pulse width of SETs are less mature than those for measuring SEUs. We present four circuits for measuring SETs, an analysis of their capabilities and the subtleties in their implementation. Post-layout circuit simulation results are presented for a test-chip implemented in 28 nm FSDOI technology and integrating these detectors.