Evaluation of a system for trace and particle analysis based on resonance ionization of sputtered atoms

For the analysis of actinide containing micron-size particles, a new experimental setup has been evaluated which uses sputtered neutral atoms instead of secondary ions. The atoms are post-ionized with lasers, either non-resonantly or resonantly. First experiments on non-resonant ionization of micron-size uranium oxide particles have shown that the sputter yields for secondary neutral atoms are much higher than for secondary ions, and uranium particles