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Effects of Al Preflow on the Uniformity of an AlN Nucleation Layer and GaN Grown on Si (111) Substrate

Authors :
Jinbang Ma
Yachao Zhang
Yixin Yao
Tao Zhang
Yifan Li
Qian Feng
Zhen Bi
Jincheng Zhang
Yue Hao
Source :
Journal of Electronic Materials. 51:3342-3349
Publication Year :
2022
Publisher :
Springer Science and Business Media LLC, 2022.

Details

ISSN :
1543186X and 03615235
Volume :
51
Database :
OpenAIRE
Journal :
Journal of Electronic Materials
Accession number :
edsair.doi...........c9e8ca3b8b8bc382cfbd0d6ddf0ae647