Transmission Electron Microscopy Analysis of Mo–W–S–Se Film Sliding Contact Obtained by Using Focused Ion Beam Microscope and In Situ Microtribometer

MLA

A. Shiveley, et al. “Transmission Electron Microscopy Analysis of Mo–W–S–Se Film Sliding Contact Obtained by Using Focused Ion Beam Microscope and In Situ Microtribometer.” Tribology Letters, vol. 32, Sept. 2008, pp. 49–57. EBSCOhost, https://doi.org/10.1007/s11249-008-9360-z.

APA

A. Shiveley, Andrey A. Voevodin, Jianjun Hu, R. Wheeler, Jeffrey S. Zabinski, & Paul A. Shade. (2008). Transmission Electron Microscopy Analysis of Mo–W–S–Se Film Sliding Contact Obtained by Using Focused Ion Beam Microscope and In Situ Microtribometer. Tribology Letters, 32, 49–57. https://doi.org/10.1007/s11249-008-9360-z

Chicago

A. Shiveley, Andrey A. Voevodin, Jianjun Hu, R. Wheeler, Jeffrey S. Zabinski, and Paul A. Shade. 2008. “Transmission Electron Microscopy Analysis of Mo–W–S–Se Film Sliding Contact Obtained by Using Focused Ion Beam Microscope and In Situ Microtribometer.” Tribology Letters 32 (September): 49–57. doi:10.1007/s11249-008-9360-z.