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A Self-Tuning IoT Processor Using Leakage-Ratio Measurement for Energy-Optimal Operation
- Source :
- IEEE Journal of Solid-State Circuits. 55:87-97
- Publication Year :
- 2020
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2020.
-
Abstract
- Energy-optimal operation is one of the key requirements of the Internet-of-Things (IoT) applications to increase battery life. In this article, using a combination of dynamic voltage scaling (DVS) and adaptive body biasing (ABB), the energy-optimal operation is achieved with a given fixed operating frequency determined by application demands. Based on the observation that the ratio of leakage power to dynamic power can be an accurate indicator for the optimal operating point, the proposed method dynamically tracks the minimum energy operating points by adjusting supply voltage and body bias with very low hardware and power overhead. A custom dc–dc converter for supply voltage regulation and charge pumps for body bias generation were implemented with the proposed method in a Cortex-M0 processor. Since SRAM is included in the same energy optimization loop as the processor, a custom SRAM was designed to match the processor speed. The design is fabricated in an Mie Fujitsu Semiconductor (MIFS) 55-nm deeply depleted channel (DDC) CMOS and the proposed approach achieves energy consumption within 4.6% of optimal at 1 MHz across five process corners and temperatures from −20 °C to 125 °C. The fabricated processor achieves 6.4 pJ/cycle at 0.55-V and 500-kHz clock frequency.
- Subjects :
- Battery (electricity)
Operating point
Computer science
business.industry
020208 electrical & electronic engineering
Clock rate
Electrical engineering
Operating frequency
Biasing
Hardware_PERFORMANCEANDRELIABILITY
02 engineering and technology
Energy consumption
Process corners
Dynamic voltage scaling
Semiconductor
CMOS
Dynamic demand
Hardware_INTEGRATEDCIRCUITS
0202 electrical engineering, electronic engineering, information engineering
Voltage regulation
Electrical and Electronic Engineering
business
Voltage
Leakage (electronics)
Subjects
Details
- ISSN :
- 1558173X and 00189200
- Volume :
- 55
- Database :
- OpenAIRE
- Journal :
- IEEE Journal of Solid-State Circuits
- Accession number :
- edsair.doi...........cc843412180571b6dfa4a4c72dcae4bd
- Full Text :
- https://doi.org/10.1109/jssc.2019.2939890