Microstructural Characterization of FePt Thin Films Annealed by a Pulse Thermal Processing Technique

Authors :: Ronald D. Ott
Richard L. Martens
Tim Klemmer
I. Zana
Gregory B. Thompson
Amanda C Cole
Source :: Microscopy and Microanalysis. 13
Publication Year :: 2007
Publisher :: Oxford University Press (OUP), 2007.

Subjects :: Materials science
Pulse (signal processing)
business.industry
Thermal
Optoelectronics
Thin film
business
Instrumentation
Characterization (materials science)

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