A one‐class peeling method for multivariate outlier detection with applications in phase I SPC

Subjects

Subjects :

Clustering high-dimensional data
business.industry
Computer science
Phase (waves)
Pattern recognition
Multivariate outlier detection
Management Science and Operations Research
Class (biology)
symbols.namesake
Gaussian function
symbols
Control chart
Artificial intelligence
Safety, Risk, Reliability and Quality
business

Details

ISSN :

10991638 and 07488017

Volume :

36

Database :

OpenAIRE

Journal :

Quality and Reliability Engineering International

Accession number :

edsair.doi...........ccd64758875b3badee09ce8c7bb3ec62

Full Text :

https://doi.org/10.1002/qre.2629