Efficient Low-power Scan Test Method based on Exclusive Scan and Scan Chain Reordering

Authors :: Jinuk Kim
Dooyoung Kim
Umair Saeed Solangi
Sungju Park
Muhammad Ibtesam
Source :: JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE. 20:390-404
Publication Year :: 2020
Publisher :: The Institute of Electronics Engineers of Korea, 2020.

Subjects :: business.industry
Computer science
Scan chain
Test method
Electrical and Electronic Engineering
business
Computer hardware
Electronic, Optical and Magnetic Materials
Power (physics)

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