Determination of Optical Constants and Thickness of Polymer Semiconductor Thin Film by Reflectivity Fitting Method

Authors :: 李国龙 Li Guolong
高忙忙 Gao Mangmang
王立惠 Wang Lihui
何力军 He Lijun
李海波 Li Haibo
钟景明 Zhong Jingming
李进 Li Jin
Source :: Laser & Optoelectronics Progress. 53:043101
Publication Year :: 2016
Publisher :: Shanghai Institute of Optics and Fine Mechanics, 2016.

Subjects :: Materials science
business.industry
02 engineering and technology
Polymer semiconductor
010402 general chemistry
021001 nanoscience & nanotechnology
01 natural sciences
Reflectivity
Atomic and Molecular Physics, and Optics
0104 chemical sciences
Optics
Electrical and Electronic Engineering
Thin film
0210 nano-technology
business

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