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SIMS accurate determination of matrix composition of topological crystalline insulator material Pb1 − xSnxSe

Authors :
Piotr Dziawa
Rafal Jakiela
Marta Galicka
Adam Barcz
Gunther Springholz
Source :
Surface and Interface Analysis. 52:71-75
Publication Year :
2019
Publisher :
Wiley, 2019.

Subjects

Subjects :
Matrix composition
Materials science
Condensed matter physics
Topological insulator
Materials Chemistry
Surfaces and Interfaces
General Chemistry
Insulator (genetics)
Condensed Matter Physics
Surfaces, Coatings and Films

Details

ISSN :
10969918 and 01422421
Volume :
52
Database :
OpenAIRE
Journal :
Surface and Interface Analysis
Accession number :
edsair.doi...........ce9fc7435f4cdb0f4e2332a4fac75b31
Full Text :
https://doi.org/10.1002/sia.6705
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