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SMARTEST: A Surrogate-Assisted Memetic Algorithm for Code Size Reduction

Authors :
Zhide Zhou
Zhilei Ren
Xin Chen
He Jiang
Guojun Gao
Source :
IEEE Transactions on Reliability. 71:190-203
Publication Year :
2022
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2022.

Details

ISSN :
15581721 and 00189529
Volume :
71
Database :
OpenAIRE
Journal :
IEEE Transactions on Reliability
Accession number :
edsair.doi...........d048f979bf5e5d2209198728620695a4