Characterizing Li in partially lithiated layer materials using atomic‐resolution imaging, modeling, and simulation

Authors :: Arthur Dobley
Manish Kumar Singh
Shayani Parida
Avinash M. Dongare
Chanchal Ghosh
C. Barry Carter
Source :: Journal of the American Ceramic Society. 105:1581-1595
Publication Year :: 2021
Publisher :: Wiley, 2021.

Subjects :: Modeling and simulation
Materials science
Atomic resolution
business.industry
Materials Chemistry
Ceramics and Composites
Optoelectronics
High-resolution transmission electron microscopy
business
Layer (electronics)

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