Investigation of structural defects and beam induced transitions in MgV2O4 nanocrystals using atomic resolved scanning transmission electron microscopy

Authors :: Linhua Hu
Francisco Lagunas
Robert F. Klie
Jordi Cabana
Grant C. B. Alexander
Source :: Microscopy and Microanalysis. 27:1502-1503
Publication Year :: 2021
Publisher :: Oxford University Press (OUP), 2021.

Subjects :: Materials science
Nanocrystal
business.industry
Scanning transmission electron microscopy
Optoelectronics
business
Instrumentation
Beam (structure)

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