Electron Microscopy and Analysis, 1981: Conference Series No 61

M J Goringe (ed) 1982 Bristol: The Institute of Physics xvi + 563 pp price £32 (IOP members' price £24) These proceedings contain the papers presented at The Institute of Physics Electron Microscopy and Analysis Group conference held at the University of Cambridge in September 1981 (EMAG '81). The sessions concerned beamsensitive materials, instrumentation, data acquisition and processing, microanalysis, multi-signal analytical electron microscopy, electron scattering and diffraction, image formation and analysis, high resolution, surfaces, defects in materials, and semiconductors.