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Pragmatic design of nanoscaleimulti-gate CMOS

Authors :
Lingquan Wang
Ji-Woon Yang
V.P. Trivedi
Jerry G. Fossum
Seung-Hwan Kim
Source :
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
Publication Year :
2005
Publisher :
IEEE, 2005.

Abstract

Three-dimensional numerical device simulations are done to gain physical insights on multi-gate FinFETs, which portend the infeasibility of nanoscale triple-gate CMOS, and process/physics-based device/circuit simulations are done to check the concept of pragmatic nanoscale double-gate CMOS design, showing encouraging performance projections near the end of the SIA 2003 ITRS (2003).

Details

Database :
OpenAIRE
Journal :
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004.
Accession number :
edsair.doi...........d415d8911e93cc0326205a7a5b4d39a0