Back to Search
Start Over
Role of defect density in the TiOx protective layer of the n-Si photoanode for efficient photoelectrochemical water splitting
- Source :
- Journal of Materials Chemistry A. 11:3987-3999
- Publication Year :
- 2023
- Publisher :
- Royal Society of Chemistry (RSC), 2023.
-
Abstract
- Understanding the role of defect density in thick oxide passivation layer in electrolyte/oxide/semiconductor (EOS) junction photoanode system is critical for efficient photo-electrochemical water splitting with long-term stability.
Details
- ISSN :
- 20507496 and 20507488
- Volume :
- 11
- Database :
- OpenAIRE
- Journal :
- Journal of Materials Chemistry A
- Accession number :
- edsair.doi...........d535f1c074304a080da2b168144a651e