Cite
Simultaneous Determination of the Carrier Concentration, Mobility and Thickness of SiC Homo-Epilayers Using Terahertz Reflectance Spectroscopy
MLA
Sadafumi Yoshida, et al. “Simultaneous Determination of the Carrier Concentration, Mobility and Thickness of SiC Homo-Epilayers Using Terahertz Reflectance Spectroscopy.” Materials Science Forum, Sept. 2007, pp. 423–26. EBSCOhost, https://doi.org/10.4028/www.scientific.net/msf.556-557.423.
APA
Sadafumi Yoshida, Yasuto Hijikata, Hiroyuki Yaguchi, & Shingo Oishi. (2007). Simultaneous Determination of the Carrier Concentration, Mobility and Thickness of SiC Homo-Epilayers Using Terahertz Reflectance Spectroscopy. Materials Science Forum, 423–426. https://doi.org/10.4028/www.scientific.net/msf.556-557.423
Chicago
Sadafumi Yoshida, Yasuto Hijikata, Hiroyuki Yaguchi, and Shingo Oishi. 2007. “Simultaneous Determination of the Carrier Concentration, Mobility and Thickness of SiC Homo-Epilayers Using Terahertz Reflectance Spectroscopy.” Materials Science Forum, September, 423–26. doi:10.4028/www.scientific.net/msf.556-557.423.