Synchrotron X-ray Scanning Tunneling Microscopy: A Novel Approach for the Nanoscale Characterization of Functional Magnetic Materials with Chemical Contrast

The real-space observation of magnetic structure using scanning probe microscopy (SPM) methods or synchrotron-based microscopy continues to have a tremendous impact on our understanding of functional magnetic materials. However, although SPM methods provide high spatial resolution, they lack direct chemical contrast and the ability to quantify magnetic moments. X-ray microscopy, on the other hand, can provide chemical as well as magnetic sensitivity, but the spatial resolution is limited.