Back to Search
Start Over
Processing and Characterization of Inorganic Films for Optical Waveguide Components
- Source :
- MRS Proceedings. 597
- Publication Year :
- 1999
- Publisher :
- Springer Science and Business Media LLC, 1999.
-
Abstract
- Optical communications are becoming technologically important on progressively shorter length scales. As computer chip speeds increase longer metal wire interconnects become problematic and may limit device performance. Wide bandwidth optical interconnects may be used to address this problem. Silicon oxide and silicon nitride were explored as prospective optical and processing materials in the making of optical interconnects. Etching of slopes, which would be an important process for making optical interconnects, was studied. Slopes with angles ranging from 5 to 50 degrees were fabricated using a silicon oxide / silicon nitride stack.
- Subjects :
- Materials science
business.industry
Optical communication
Hardware_PERFORMANCEANDRELIABILITY
Chip
Waveguide (optics)
Characterization (materials science)
chemistry.chemical_compound
Stack (abstract data type)
Silicon nitride
chemistry
Etching (microfabrication)
Hardware_INTEGRATEDCIRCUITS
Optoelectronics
business
Silicon oxide
Subjects
Details
- ISSN :
- 19464274 and 02729172
- Volume :
- 597
- Database :
- OpenAIRE
- Journal :
- MRS Proceedings
- Accession number :
- edsair.doi...........da26a0630e35d6ca863f4132859849e8
- Full Text :
- https://doi.org/10.1557/proc-597-81