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Processing and Characterization of Inorganic Films for Optical Waveguide Components

Authors :
X. Huang
Peter D. Persans
Shom Ponoth
N. Agarwal
Joel L. Plawsky
Source :
MRS Proceedings. 597
Publication Year :
1999
Publisher :
Springer Science and Business Media LLC, 1999.

Abstract

Optical communications are becoming technologically important on progressively shorter length scales. As computer chip speeds increase longer metal wire interconnects become problematic and may limit device performance. Wide bandwidth optical interconnects may be used to address this problem. Silicon oxide and silicon nitride were explored as prospective optical and processing materials in the making of optical interconnects. Etching of slopes, which would be an important process for making optical interconnects, was studied. Slopes with angles ranging from 5 to 50 degrees were fabricated using a silicon oxide / silicon nitride stack.

Details

ISSN :
19464274 and 02729172
Volume :
597
Database :
OpenAIRE
Journal :
MRS Proceedings
Accession number :
edsair.doi...........da26a0630e35d6ca863f4132859849e8
Full Text :
https://doi.org/10.1557/proc-597-81