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Postprocessing for Improved Accuracy and Resolution of Spread Spectrum Time-Domain Reflectometry

Authors :
Michael A. Scarpulla
Joel B. Harley
Evan Benoit
Naveen Kumar Tumkur Jayakumar
Cynthia Furse
Samuel Kingston
Mashad Uddin Saleh
Source :
IEEE Sensors Letters. 3:1-4
Publication Year :
2019
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2019.

Abstract

Reflectometry, which is commonly used for locating faults on electrical wires, produces sampled time domain signatures with peaks that are often missed due to this sampling. Resultant errors in these sampled peaks translate to errors in calculating the impedance and location of the fault. Typical signal processing methods to improve the accuracy of these sampled peaks have complexity on the order of O(N2). For embedded fault location applications, algorithms with lower complexity are desired. In this article, we introduce three algorithms for improving the accuracy of the peak with a complexity of O(N). We evaluate these algorithms on the practical case of calculating the velocity of propagation and the characteristic impedance of a photovoltaic (PV) cable using spread spectrum time-domain reflectometry.

Details

ISSN :
24751472
Volume :
3
Database :
OpenAIRE
Journal :
IEEE Sensors Letters
Accession number :
edsair.doi...........da4cd1b7740223d97df4a9e7617df39f
Full Text :
https://doi.org/10.1109/lsens.2019.2916636