Back to Search Start Over

Si02/Si(100) Interfacial Lattice Strain Studied by Extremely Asymmetric X-ray Diffraction

Authors :
Yuki Ito
Takashi Emoto
Naoya Yamamoto
Yoshio Oshita
Hironori Yoshida
Koichi Akimoto
Atsushi Ogura
Source :
Transactions of the Materials Research Society of Japan. 33:603-605
Publication Year :
2008
Publisher :
The Materials Research Society of Japan, 2008.

Subjects

Subjects :
Lattice strain
Materials science
Condensed matter physics
X-ray crystallography
Synchrotron radiation

Details

ISSN :
21881650 and 13823469
Volume :
33
Database :
OpenAIRE
Journal :
Transactions of the Materials Research Society of Japan
Accession number :
edsair.doi...........dacbd1bb18e39d736c77fcdabbe3ceb2
Full Text :
https://doi.org/10.14723/tmrsj.33.603
Full Text Access
View/download PDF

Tools

Authors Abstract Subjects Details