Cite
Spectral Analysis of Nanomaterials using a Transition-Edge Sensor Microcalorimeter Mounted on a Field-Emission Scanning Electron Microscope
MLA
Yoshikazu Homma, et al. “Spectral Analysis of Nanomaterials Using a Transition-Edge Sensor Microcalorimeter Mounted on a Field-Emission Scanning Electron Microscope.” Japanese Journal of Applied Physics, vol. 47, June 2008, pp. 4835–38. EBSCOhost, https://doi.org/10.1143/jjap.47.4835.
APA
Yoshikazu Homma, Takayoshi Sasaki, Satoshi Nakayama, Keiichi Tanaka, Yukari Baba, Qinghui Li, Yuki Ono, Katsutoshi Fukuda, & Izumi Nakai. (2008). Spectral Analysis of Nanomaterials using a Transition-Edge Sensor Microcalorimeter Mounted on a Field-Emission Scanning Electron Microscope. Japanese Journal of Applied Physics, 47, 4835–4838. https://doi.org/10.1143/jjap.47.4835
Chicago
Yoshikazu Homma, Takayoshi Sasaki, Satoshi Nakayama, Keiichi Tanaka, Yukari Baba, Qinghui Li, Yuki Ono, Katsutoshi Fukuda, and Izumi Nakai. 2008. “Spectral Analysis of Nanomaterials Using a Transition-Edge Sensor Microcalorimeter Mounted on a Field-Emission Scanning Electron Microscope.” Japanese Journal of Applied Physics 47 (June): 4835–38. doi:10.1143/jjap.47.4835.