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Research on Test Model and Standardized Test Method for Electric Vehicle Drop Condition

Authors :
Zhu Haitao
Li Chun
Duan Bingxu
Tang Aotian
Wang Qinggui
Source :
2022 IEEE 4th International Conference on Power, Intelligent Computing and Systems (ICPICS).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 IEEE 4th International Conference on Power, Intelligent Computing and Systems (ICPICS)
Accession number :
edsair.doi...........dca299961dbc811db0e7871371c6ed3f

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