Cite
Analysis of thin layers and interfaces in ITO/a-Si:H/c-Si heterojunction solar cell structures by secondary ion mass spectrometry
MLA
K. Maknys, et al. “Analysis of Thin Layers and Interfaces in ITO/a-Si:H/c-Si Heterojunction Solar Cell Structures by Secondary Ion Mass Spectrometry.” Thin Solid Films, July 2006, pp. 93–97. EBSCOhost, https://doi.org/10.1016/j.tsf.2005.12.007.
APA
K. Maknys, Alexander Ulyashin, A. Yu. Kuznetsov, Bengt Gunnar Svensson, & J. S. Christensen. (2006). Analysis of thin layers and interfaces in ITO/a-Si:H/c-Si heterojunction solar cell structures by secondary ion mass spectrometry. Thin Solid Films, 93–97. https://doi.org/10.1016/j.tsf.2005.12.007
Chicago
K. Maknys, Alexander Ulyashin, A. Yu. Kuznetsov, Bengt Gunnar Svensson, and J. S. Christensen. 2006. “Analysis of Thin Layers and Interfaces in ITO/a-Si:H/c-Si Heterojunction Solar Cell Structures by Secondary Ion Mass Spectrometry.” Thin Solid Films, July, 93–97. doi:10.1016/j.tsf.2005.12.007.