Back to Search Start Over

Interfaces and stresses in thin films

Authors :
Frans Spaepen
Source :
Acta Materialia. 48:31-42
Publication Year :
2000
Publisher :
Elsevier BV, 2000.

Abstract

A review of the current understanding of the effect of interfaces on the intrinsic stresses in polycrystalline thin films is given. Special attention is paid to the measurement, modeling and application of surface and interface stresses. Mechanisms for generating the compressive and tensile components of the intrinsic stress are assessed. Prospects for future research are presented.

Details

ISSN :
13596454
Volume :
48
Database :
OpenAIRE
Journal :
Acta Materialia
Accession number :
edsair.doi...........dd4b650d4ff65e94e5bc45afe2366145
Full Text :
https://doi.org/10.1016/s1359-6454(99)00286-4