Back to Search
Start Over
Interfaces and stresses in thin films
- Source :
- Acta Materialia. 48:31-42
- Publication Year :
- 2000
- Publisher :
- Elsevier BV, 2000.
-
Abstract
- A review of the current understanding of the effect of interfaces on the intrinsic stresses in polycrystalline thin films is given. Special attention is paid to the measurement, modeling and application of surface and interface stresses. Mechanisms for generating the compressive and tensile components of the intrinsic stress are assessed. Prospects for future research are presented.
Details
- ISSN :
- 13596454
- Volume :
- 48
- Database :
- OpenAIRE
- Journal :
- Acta Materialia
- Accession number :
- edsair.doi...........dd4b650d4ff65e94e5bc45afe2366145
- Full Text :
- https://doi.org/10.1016/s1359-6454(99)00286-4