Secondary electron emission of reticulated foam materials

Complex material surfaces can reduce secondary electron emission (SEE) and sputtering via geometric trapping. In this work, the SEE yields for a range of open-cell reticulated carbon foam geometries are characterized using scanning electron microscopy. The total reduction in the SEE yield from carbon foams with a 3% volume fill density and 10–100 pores per inch (PPI) is shown to be between 23.5% and 35.0%. Contributions of a foam backplate are assessed by experimentally and analytically defining the critical parameter, transparency. The transparency of a foam is quantified and is shown to affect the primary electron angular dependence on the SEE yield. For the same thickness of 6 mm, it is found that higher PPI decreases foam transparency from 32% to 0% and reduces the SEE yield. The SEE yield from carbon foams is also shown to have weaker dependence on the morphology of the surface compared with fuzzes and velvets and less variation across individual sample surfaces due to the rigidity of their ligament structures and isotropic geometries.