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Influence of the Current on Electron Tunnelling into a Thin Superconducting Film

Authors :
Shigehisa Nakaya
Kousuke Uchiho
Toyoichiro Shigi
Source :
Journal of the Physical Society of Japan. 24:476-479
Publication Year :
1968
Publisher :
Physical Society of Japan, 1968.

Abstract

An anomaly has been found in the current-voltage characteristics of the electron tunnelling in a cross type Sn-SnOx-Pb junction with a small tunnelling resistance and a very thin tin film, which was proved to correspond to the superconducting-to-normal transition in the tin film. Some properties of the anomaly were also examined. It is pointed out that as the electron tunnelling method requires relatively large current through the junction with a small tunnel resistance in order to measure the energy gap directly, the superconducting state of a very thin film is disturbed by this tunnel current.

Details

ISSN :
13474073 and 00319015
Volume :
24
Database :
OpenAIRE
Journal :
Journal of the Physical Society of Japan
Accession number :
edsair.doi...........e0700506b42ad5561668c1b128199e43
Full Text :
https://doi.org/10.1143/jpsj.24.476