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Ellipsometric characterizations of individual nanoform structures

Authors :
Tim Kaeseberg
Sven Teichert
Thomas Siefke
Stefanie Kroker
Bernd Bodermann
Matthias Wurm
Jana Grundmann
Source :
Optical Technology and Measurement for Industrial Applications Conference 2021.
Publication Year :
2021
Publisher :
SPIE, 2021.

Abstract

Spectroscopic polarization measurement and control using channeled spectrum has several unique features and is useful for various spectroscopic instruments. It utilizes the strong dispersion characteristics in polarization retardation of high-order retarders so that the polarization modulation can be made without using mechanical or active elements for polarization modulation. In this presentation, we describe its principle, basic features, and several applications including a spectroscopic ellipsometer and ultrafast rotations of beam profile and polarization.

Details

Database :
OpenAIRE
Journal :
Optical Technology and Measurement for Industrial Applications Conference 2021
Accession number :
edsair.doi...........e0a3a877b5098b621ebbeeca4d22b86e
Full Text :
https://doi.org/10.1117/12.2616273