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Methods of measuring oxidation growth stresses

Authors :
A-M. Huntz
Hugh Evans
Source :
Materials at High Temperatures. 12:111-117
Publication Year :
1994
Publisher :
Informa UK Limited, 1994.

Abstract

Stresses developed isothermally at temperature in both the oxide layer and metal substrate as a consequence of the oxidation process are known as ‘growth stresses’. They seem to be an indigenous fe...

Details

ISSN :
18786413 and 09603409
Volume :
12
Database :
OpenAIRE
Journal :
Materials at High Temperatures
Accession number :
edsair.doi...........e0e286894278a7e2e5ea1e9989883ed1
Full Text :
https://doi.org/10.1080/09603409.1994.11689476