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A failure analysis framework of ReRAM In-Memory Logic operations

Authors :
L. Brackmann
A. Jafari
C. Bengel
M. Mayahinia
R. Waser
D. Wouters
S. Menzel
M. Tahoori
Source :
2022 IEEE International Test Conference in Asia (ITC-Asia).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 IEEE International Test Conference in Asia (ITC-Asia)
Accession number :
edsair.doi...........e222c1d27144551ca40e66090f9ba050
Full Text :
https://doi.org/10.1109/itcasia55616.2022.00022