Cite
Gate oxide Reliability assessment optimization
MLA
Frederic Monsieur, et al. “Gate Oxide Reliability Assessment Optimization.” Microelectronics Reliability, vol. 42, Sept. 2002, pp. 1505–08. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........e2a45614e2bf5ec92ac6db609cd0e9ef&authtype=sso&custid=ns315887.
APA
Frederic Monsieur, Gerard Ghibaudo, Emmanuel Vincent, G. Pananakakis, David Roy, & Sylvie Bruyere. (2002). Gate oxide Reliability assessment optimization. Microelectronics Reliability, 42, 1505–1508.
Chicago
Frederic Monsieur, Gerard Ghibaudo, Emmanuel Vincent, G. Pananakakis, David Roy, and Sylvie Bruyere. 2002. “Gate Oxide Reliability Assessment Optimization.” Microelectronics Reliability 42 (September): 1505–8. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........e2a45614e2bf5ec92ac6db609cd0e9ef&authtype=sso&custid=ns315887.