Back to Search
Start Over
Oxygen Defect Stability in Amorphous, C-Axis Aligned, and Spinel IGZO
- Source :
- ACS Applied Electronic Materials. 3:4037-4046
- Publication Year :
- 2021
- Publisher :
- American Chemical Society (ACS), 2021.
Details
- ISSN :
- 26376113
- Volume :
- 3
- Database :
- OpenAIRE
- Journal :
- ACS Applied Electronic Materials
- Accession number :
- edsair.doi...........e30ed9bd89647061794afc747a2ae354